Agilent Technologies Power Supply PN 8510 16 User Manual

Agilent PN 8510-16  
Controlling Test Port Output  
Power Flatness  
Product Note  
UNCORRECTED POWER  
CORRECTED POWER  
OUTPUT  
POWER  
Agilent 8510C Network Analyzer  
 
The Agilent 8511B frequency converter test  
set may be used with the test port power flatness-  
correction feature. The range of the test port  
power is determined by the available power of  
the 8360 source and the insertion loss of the com-  
ponents added to the measurement system.  
System Configuration  
The basic 8510C measurement system configura-  
tion needed for test port flatness correction is  
shown in Figure 1. A single channel power meter  
such as the Agilent 437B, E4418A, or E4418B is  
required, along with a compatible sensor, for per-  
forming the power flatness calibration. Power  
meters with the 437B command set must be used  
for the power level flatness correction.  
85107B Measurement System  
8510C network analyzer  
8517B test set  
8485A  
power sensor  
E4418B  
power meter  
83651B  
synthesized sweeper  
Figure 1. Basic Agilent 85107B measurement system con-  
figuration for test port flatness correction  
3
 
When the flatness correction is enabled in an  
8510C measurement system the analyzer’s Power  
Source 1 softkey controls the test port power level.  
The source and test set used will determine the  
available test port power range.  
Flatness-Correction Operation  
The basic setup procedure to obtain flat test port  
output power is illustrated in Table 1. To simplify  
the execution of the procedure, the front panel  
hardkeys are enclosed in [brackets]. The softkeys  
are enclosed in {braces}. Table 2 provides the pro-  
cedure for setting up the power meter. The net-  
work analyzer should be reset before performing  
any procedures. The flatness-correction calibration  
can be performed in step, ramp, or frequency list  
sweep mode. Figure 2 illustrates test port power  
versus frequency with and without flatness correc-  
tion using an 85107B measurement system.  
The maximum leveled power the source can out-  
put at different frequency spans is indicated in  
Table 3. Once the flatness correction is enabled,  
the test port power level must be set within the  
power range presented in Table 4 for common  
source/test set combinations.  
Figure 2. Comparison of test port power without flatness correction (channel 1)  
and with flatness correction (channel 2)  
4
 
Table 1. Flatness-correction calibration procedure  
8510C Keystrokes  
Description  
Set up the power meter (see Table 2)  
For proper operation, the E4418B must be set up before initiating the flatness-correction routine.  
See Table 2 for specific instructions.  
Verify the power meter's address on the 8510 system  
[LOCAL]  
When shipped from the factory, the address of the power meter is 13. If this conflicts with another instrument on the system bus,  
{POWERMETER}  
change the address of the conflicting instrument. The power meter must be set to address 13 in order for the firmware to func-  
tion properly. Press [SYSTEM/INPUTS], {REMOTE INTERFACE} and {INTERFACE OVERVIEW} on the E4418B to ensure the  
power meter’s address is set to 13. Verify that the power meter is connected to the system bus.  
Set up the analyzer and measurement  
Set up the start/stop frequencies and the measurement type (for example, S11, S12).  
Adjust the number of analyzer trace points (if needed)  
STIMULUS [MENU]  
When the flatness calibration is initiated, the analyzer sends the source a list of flatness-correction frequencies equal to the  
{NUMBER OF POINTS} number of trace points set on the analyzer.  
{POINTS}  
Set the source to the maximum leveled power  
STIMULUS [MENU]  
{POWER MENU}  
{POWER SOURCE 1}  
P1 [x1]  
Set the 8360 for maximum specified power (P1) at the highest frequency in the span; see Table 3. At higher power levels, the  
power meter will take less time to settle between measurement points during the calibration process.  
Connect the power sensor to the active test port and begin the flatness calibration  
Initiate flatness calibration  
{POWER FLATNESS}  
Do not cycle the power on the analyzer or the source during the calibration process. The calibration may be aborted at any time by  
{CALIBRATE FLATNESS} pressing any key on the analyzer’s front panel. Aborting the calibration is not recommended, since the command may cause the  
system to freeze. By pressing {CALIBRATE FLATNESS} the analyzer will remind the user to zero the power meter and connect the  
power sensor to the source. Press {CALIBRATE FLATNESS} again on the analyzer to initiate the calibration. Once initiated, the  
analyzer retrieves the power meter measurement data and transfers it to the 8360 where it is processed and stored with the  
appropriate correction frequency. During the flatness-correction calibration, the analyzer will display MEASURING DATA, xx%  
DONE, PRESS ANY KEY TO ABORT. The xx% DONE indicates the percentage of the total number of correction points that have  
been measured; it is not an indication of elapsed measurement time. When the flatness-correction calibration is completed, the  
analyzer will automatically store the correction table into register 1 of the source. Any new calibration of the source will overwrite  
the flatness-correction table.  
Activate the flatness-correction  
{FLATNESS ON}  
The source output power will now be unleveled as it attempts to output the test port power level (Power Source 1) plus the flat-  
ness correction for each measurement point in the frequency span. IF Overload or Source 1 Warning—RF Unleveled may be dis-  
played on the analyzer until the test power level is reduced.  
Set the test port power level  
STIMULUS [MENU]  
{POWER MENU}  
{POWER SOURCE 1}  
P2 [x1]  
Set the test port power level (P2) equal to or below the maximum allowed test port power (see Table 3) for the highest frequency  
in the measurement span. A constant power level equivalent to P2 will now be available at the test port. The flatness-correction  
calibration can be varified using the E4418B to measure the power at certain CW frequencies in the frequency range.  
Perform the measurement calibration  
Compensate for systematic errors by performing a measurement calibration (if desired). Although a measurement calibration can  
be performed before or after the flatness-correction calibration with or without correction enabled, it is recommended that the cal-  
ibration be performed after the flatness correction is enabled. The calibration is no longer valid if the source power is changed  
after performing the calibration.  
Connect the DUT to the test port  
5
 
Table 2. Agilent E4418B power meter setup  
E4418B Keystrokes  
Description  
Preset and zero the power meter  
[PRESET/LOCAL]  
{CONFIRM}  
[ZERO/CAL]  
{ZERO}  
Return the power meter to a known state.  
Set up the 437B emulation on the power meter  
[SYSTEM/INPUTS]  
{REMOTE INTERFACE}  
{COMMAND SET}  
{437B}  
The 437B command set must be activated in order to perform the power flatness calibration. Power meters that can be used in  
place of the E4418B are the E4418A and 437B. The E4419B dual channel power meter does not have the 437B command set and  
cannot be used to perform the calibration.  
Connect the sensor to the power reference output on the power meter and calibrate the power sensor  
[ZERO/CAL]  
Choose a power sensor that can perform within the desired frequency span. To determine which power sensors are compatible  
POWER REF {ON}  
{CAL}  
POWER REF {OFF}  
with the E4418B, consult the user’s guide. Agilent E-Series power sensors cannot be used for calibration because they are incom-  
patible with the 437B command set. Additional configuration may be needed to connect the sensor to the power reference;  
this information can also be found in the E4418B user’s guide, part number E4418-90032. After calibrating the sensor, the  
power meter should display a reading of 0.0 dBm (or 1 mW) when the sensor is connected to the reference and the power  
reference is activated.  
Select or create the calibration factor table that applies to the power sensor in use (if needed)  
[SYSTEM/INPUTS]  
{TABLES}  
The factory enters nine tables of typical calibration factors for nine different sensors in the E4418B. Use the up and down  
arrows on the display to highlight the desired table. If tables 2 through 9 are cleared, the data previously stored in those tables  
{SENSOR CAL TABLES} cannot be restored. See the E4418B user’s guide, part number E4418-90032, for information on entering custom calibration  
HIGHLIGHT TABLE  
TABLE {ON}  
{DONE}  
factor tables.  
Table 3. Agilent 8360 series synthesized sweeper maximum leveled power (in dBm)  
Maximum Frequency  
83620B  
83621B  
83623B  
83623L  
83631B  
83651B  
20 GHz  
26.5 GHz  
40 GHz  
50 GHz  
13  
10  
17  
15  
10  
10  
4
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
4
N/A  
N/A  
3
0
Table 4. Settable test port power ranges (assuming no test set step attenuation)  
RF Source  
8510 Test Set  
83620B/83621B  
with 8514B  
83631B  
with 8515A  
83651B  
with 8515A  
with 8517B  
with 8517B, Option 007  
Frequency  
Test Port Power Levels [Pmax to Pmin] (in dBm)  
0.05 GHz  
2.5 to –20.5  
1 to –22  
–7.5 to –27  
N/A  
–3.5 to –26  
–6 to –29  
–13.5 to –30  
N/A  
–3.5 to –26  
–6 to –29  
–13.5 to –30  
25 to –30  
N/A  
–1.5 to –21.5  
5 to –21  
2 GHz  
0.5 to –23.5  
–7.5 to –30  
13.5 to –30  
–20 to –30  
–27 to –30  
5 to –21  
20 GHz  
26.5 GHz  
40 GHz  
50 GHz  
2 to –23  
1 to –24  
N/A  
N/A  
– 3 to –21.5  
–13 to –29  
N/A  
N/A  
N/A  
6
 
Operational Considerations  
Calibration time  
The user may choose to speed up the calibration process by reducing the number of trace points on the  
analyzer. Table 5 provides some typical calibration times for flatness correction over the full frequency  
span of the source for different source/test set combinations. Calibration times may be slightly reduced by  
increasing the stepped measurement speed with the quick step feature on the Agilent 8510C.  
Table 5. Typical calibration times (in minutes) versus number of calibration points with maximum leveled source power  
Number of Points  
83620B/83621B  
83631B  
83651B  
with 8514B  
with 8515A  
with 8515A  
with 8517B  
801  
401  
201  
101  
51  
30  
15  
8
32  
16  
8
40  
20  
10  
5
60  
30  
15  
8
4
4
2
2
2
4
The following error messages may occur while  
Power control with flatness correction  
attempting to enable the flatness correction and/or  
reducing the test port power level:  
The ability to compensate for power variations  
across the entire measurement span of the source  
will depend on the highest leveled output power  
the source can produce and the amount of power  
compensation required. The test port power may  
be adjusted over the entire Pmax to Pmin range with-  
out degrading the flatness-correction calibration.  
• If flatness correction is enabled before reducing  
the test port power level, IF Overload or Source  
1 Warning—RF Unleveled may be displayed on  
the analyzer as the source becomes unleveled.  
Unleveling occurs when the source attempts to  
output its maximum specified power plus the  
flatness correction.  
• If the output power is reduced to a suitable test  
port power level before turning flatness correc-  
tion on, No IF Found may be displayed. There  
may not be sufficient output power from the  
source for the 8510C to phase lock to the signal.  
Table 4 shows test port power ranges for various  
source/test set combinations. To determine the test  
port power levels for a particular frequency span,  
choose a power level between Pmax of the highest  
frequency in the measurement span and Pmin of the  
lowest frequency in the measurement span. For  
example, the power range for a 50 MHz to 20 GHz  
span with an 83621B/8515A system is –13.5 dBm  
to –26 dBm. A high-power Agilent 83623B adds  
7 dBm to Pmax of the 83621B. If a user sets up a  
50 MHz to 20 GHz measurement with an 83623B  
and an 8515A, the test port power range is  
–6.5 dBm to –26 dBm.  
These error messages should disappear when flat-  
ness correction is enabled with the appropriate  
test port power level setting. If the test port power  
level is not correctly reduced, the source will  
become unleveled and try to output maximum  
power. Although flatness correction will be applied  
to the unleveled signal, the measurement for the  
unleveled portion of the frequency span will not be  
valid because the flatness-correction feature can-  
not compensate for the inconsistent power varia-  
tions that occur.  
7
 
Verifying a flatness-correction calibration  
When to recalibrate  
To verify the flatness-correction calibration, the  
power sensor should be reconnected to the test  
port to measure the test port power at individual  
frequencies. Since the measurement system is  
calibrated in 50W, inaccuracies will occur when  
a device is not well matched. Since the flatness-  
correction calibration is not a real-time power  
leveling feature, it cannot correct for mismatches  
that occur between the test port and the DUT.  
The flatness-correction calibration does not need  
to be repeated unless: (1) the user wants to cali-  
brate over a wider frequency range, (2) the meas-  
urement path between the source and the test  
device changes, (3) the RF source power changes,  
(4) the user wants to increase the number of meas-  
urement points, or (5) the environmental condi-  
tions under which the original calibration was per-  
formed changes dramatically.  
Adjusting the frequency span after calibration  
Once a flatness-correction calibration with the  
maximum number of points (801 points) has been  
completed, adjustments can be made to reduce the  
number of trace points on the analyzer. The user  
may also change the measurement frequency span  
to a subset of the original calibration span without  
invalidating the calibration. The source will output  
corrected power at the appropriate measurement  
points.  
Keep in mind that the flatness-correction table  
is automatically saved into register 1 of the RF  
source. Any new calibration of the source will  
overwrite the flatness-correction table. If multiple  
flatness-correction calibrations are performed,  
only the most recent calibration will be saved for  
the DUT.  
Using test set step attenuators with flatness correction  
If lower test port power levels are desired, test  
set step attenuators may be used. The frequency  
response of the step attenuators can be eliminated  
from the measurement by performing the flatness-  
correction calibration with the appropriate atten-  
uation enabled. High sensitivity power sensors  
(8485D to 26.5 GHz and 8487D to 50 GHz) are  
available for power measurements from –20 dBm  
to –70 dBm. The limitation of making power meter  
measurements at these low power levels is that the  
actual calibration process takes considerably more  
time since the power meter takes much longer to  
settle at each correction frequency.  
This capability is particularly useful for users who  
are testing a number of devices with different  
frequency spans at the same test station. In this  
case, the user may choose to perform the flatness-  
correction calibration with the maximum number  
of calibration points across the full frequency  
range. Subsets of the original calibration frequency  
range can then be used to meet the specific testing  
requirements of the individual devices.  
8
 
Using test port 1 calibrations on test port 2  
Flatness corrections in fixture or wafer-probing  
environments  
In most cases, port 1 will be the input port of the  
DUT. When port 2 must be used as the input port  
to the device, the user may choose to use a port 1  
flatness-correction calibration on port 2 since the  
Test port flatness correction may be applied  
with any other power function. Power slope may  
be used to compensate for the path loss in non-  
coaxial environments such as microstrip and  
coplanar waveguide measurement systems. The  
maximum test port power for any particular fre-  
quency span cannot exceed the maximum test port  
power level for the highest frequency in the span  
(see Table 3) minus the maximum power slope  
compensation required.  
1
port 1 and port 2 signal paths are symmetrical.  
Figure 3 illustrates the use of port 1 flatness cor-  
rection on both ports 1 and 2. The port 2 measure-  
ment with port 1 flatness-correction calibration is  
optimized for measurements below 30 GHz.  
Figure 3. Corrected test port power using port 1 flatness correction on port 1  
(channel 1) and port 2 (channel 2)  
1. Test sets with option 003 (high forward dynamic range) cannot be used because  
the reverse transmission dynamic range is degraded.  
9
 
Practical Application Examples  
Absolute output power measurements with  
flatness correction  
One benefit of the flatness-correction capability is  
the ability to measure the absolute output power of  
active devices. Since the input power level to the  
DUT is kept constant, the magnitude offset feature  
of the Agilent 8510 can be used to display absolute  
output power across the entire frequency span of  
the device. Table 6 shows the procedure for  
absolute output power versus frequency measure-  
ments with test port flatness correction.  
Table 6. Absolute output power measurements with flatness correction  
8510C Keystrokes  
Description  
Set up the source and power meter as illustrated in Figure 2  
Set up the measurement  
PARAMETER [MENU]  
{USER 2 b2}  
Set up the analyzer for a b2 measurement.  
Activate the test port power flatness-correction  
Perform the flatness correction calibration. Set the test port power level and enable the flatness  
correction as explained in Table 1.  
Connect a thru  
Perform a thru calibration with the flatness correction enabled  
[CAL]  
Perform a thru calibration to eliminate the frequency response errors of the port 2 path in the measurement. Be sure to  
{CAL#…}  
{CALIBRATE:RESPONSE}  
{THRU}  
include any attenuators and/or adapters which are part of the measurement in the thru calibration. It may be necessary to  
swap adapters for the thru connection. Any cal set may be selected to access the response calibration in the calibration  
menu structure  
{DONE RESPONSE}  
{CAL SET #}  
Connect the DUT  
Measure the absolute output power  
RESPONSE [MENU]  
{MORE}  
When the device is reconnected, the gain will be displayed. Enter a magnitude offset equivalent to the test port power level  
(P2). Measure the absolute output power at any point in the measurement span.  
{MAGNITUDE OFFSET}  
P2 [x1]  
10  
 
output power, and gain compression measurements  
procedures are covered. For more information on  
measuring amplifiers, refer to Agilent product note  
8510-18, literature number 5963-2352E.  
Amplifier measurement example  
Step-by-step instructions for setting up and apply-  
ing flatness corrections for the measurement of  
an amplifier are shown in Table 7. Gain, absolute  
Table 7. Absolute output power and 1 dB compression measurements of an amplifier  
8510C Keystrokes  
Description  
Perform the flatness-correction calibration as presented in Table 1  
Set up the test port power level  
STIMULUS [MENU]  
{POWER MENU}  
Set the test port power below the amplifier’s compression level (PA) and within the settable power range presented  
in Table 4.  
{POWER SOURCE 1}  
PA [x1]  
Set up a b2 measurement and connect a thru  
PARAMETER [MENU]  
{USER 2 b2}  
Set up the analyzer for a b2 measurement.  
Perform a thru calibration  
[CAL]  
{CAL#…}  
{CALIBRATE:RESPONSE}  
{THRU}  
Perform a thru calibration to eliminate the frequency response errors of the port 2 path in the measurement. Be sure to  
include any attenuators and/or adapters which are part of the measurement in the thru calibration. It may be necessary  
to swap adapters for the thru calibration. Any cal set may be selected to access the response calibration in the calibration  
menu structure.  
{DONE RESPONSE}  
{CAL SET #}  
Connect the amplifier and measure the absolute output power  
RESPONSE [MENU]  
{MORE}  
{MAGNITUDE OFFSET}  
PA [x1]  
Display the absolute power by entering a magnitude offset (PA) equivalent to the test port power level during the thru  
calibration. Gain can be calculated for any measurement point by subtracting Pin from Pout (or Pmeasured/PA). The gain  
can also be measured by performing an S21 measurement.  
[AUTO]  
Set up a 1 dB compression measurement and normalize the trace  
[DISPLAY]  
By normalizing the measurement, the first frequency point to drop by 1 dB will be easy to identify.  
{DATA AND MEMORIES}  
{DISPLAYMEMORY 1}  
{MATH(/)}  
Adjust the display  
[REF VALUE]  
1 [x1]  
Move the reference line near the bottom of the grid to allow full use of the display.  
[REF POSN]  
USE DOWN ARROW  
[SCALE]  
1 [x1]  
Increase power to find the 1 dB gain compression point  
STIMULUS [MENU]  
{POWER MENU}  
{POWER SOURCE 1}  
USE UP ARROW  
[MARKER]  
Increase the test port power 1 dB at a time until the trace visibly drops. Then use the knob to adjust the power until  
a 1 dB drop in the trace occurs. Note the test port power and use a marker to measure the frequency.  
Measure the absolute output power at the 1 dB compression point  
[REF POSN]  
Move the reference level back to the center of the screen and display the absolute output power versus frequency.  
[DISPLAY]  
The marker will indicate the amplifier's absolute output power for the1 dB compression point.  
{DATA AND MEMORIES}  
{DISPLAY:DATA}  
[AUTO]  
11  
 
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